Firstly, I would like to take this opportunity to thank all of you who have been integral to the continued success of the Japan Automatic Identification Systems Association. This year we are proud to host the eleventh “AUTO-ID & COMMUNICATION EXPO 2013”, the premier automatic identification systems and solutions exposition in Japan. As the singular exposition of its kind, the AUTO-ID EXPO continues to capture attention throughout the world. I would like to express my deep appreciation for your vital contributions and cooperation, which have been instrumental in twelve successful AUTO-ID EXPO events, and a total of 27 counting all of the forerunning SCAN-TECH JAPAN events.
This Expo features myriad new products and new technologies with an eye toward creating an Expo that is closer to the user. As a new plan for this year’s Expo, we created an Automatic Identification Solutions Zone in order to showcase the broad range of automatic identification solutions. And also we created a NFC Zone in order to showcase the NFC solutions.
We are also very fortunate to have Professor Araki, from the Economics Department at Sophia University, return to lead the BT SPICE Automatic Identification Systems Seminar: an even more interesting subject than the one he treated at EXPO last year.
In terms of generating new business opportunities, the 15th Annual AUTO-ID EXPO is the premier event for all of us in the field of Automatic Identification Systems, and the EXPO will clearly be enhanced and maximized by your participation again this year. We look forward to seeing you and thank you for your continued consideration.