AUTOID EXPO 2010

Firstly, I would like to take this opportunity to thank all of you who have been integral to the continued success of the Japan Automatic Identification Systems Association. This year we are proud to host the eleventh “AUTO-ID EXPO 2010”, the premier automatic identification systems and solutions exposition in Japan. As the singular exposition of its kind, the AUTO-ID EXPO continues to capture attention throughout the world. I would like to express my deep appreciation for your vital contributions and cooperation, which have been instrumental in eleven successful AUTO-ID EXPO events, and a total of 24 counting all of the forerunning SCAN-TECH JAPAN events.
This Expo features myriad new products and new technologies with an eye toward creating an Expo that is closer to the user. As a new plan for this year’s Expo, we created an Automatic Identification Solutions Exhibit Zone in order to showcase the broad range of automatic identification solutions. We aim to attract new users to attend the Expo with this plan, and we will continue to hold two events which were very popular last year, the Introductions to Solutions by Exhibitors (presentation and participation free of charge) and New Product Presentations by Exhibitors (presentation and participation free of charge).
We are also very fortunate to have Professor Araki, from the Economics Department at Sophia University, return to lead the BT SPICE Automatic Identification Systems Seminar: an even more interesting subject than the one he treated at EXPO last year.
In terms of generating new business opportunities, the 12th Annual AUTO-ID EXPO is the premier event for all of us in the field of Automatic Identification Systems, and the EXPO will clearly be enhanced and maximized by your participation again this year. We look forward to seeing you and thank you for your continued consideration.